SystemC AMS – holistic analog, digital, hardware and software system-level modeling

Research output: Contribution to journal › Research article › Invited › peer-review

Contributors

  • Karsten Einwich - , Fraunhofer Institute for Integrated Circuits IIS, Design Automation Division (Author)
  • Thomas Uhle - , Fraunhofer Institute for Integrated Circuits IIS, Design Automation Division (Author)

Details

Original languageEnglish
Pages (from-to)28-33
Number of pages6
JournalEDA Tech Forum
Volume7
Issue number1
Publication statusPublished - 2010
Peer-reviewedYes
Externally publishedYes

Conference

Title2010 Design, Automation and Test in Europe Conference and Exhibition
Abbreviated titleDATE 2010
Conference number13
Duration8 - 12 March 2010
Website
CityDresden
CountryGermany