Synthesis and evaluation of new copper ketoiminate precursors for a facile and additive-free solution-based approach to nanoscale copper oxide thin films

Research output: Contribution to journalResearch articleContributedpeer-review

Contributors

  • Sarah Karle - , Ruhr University Bochum (Author)
  • Detlef Rogalla - , Ruhr University Bochum (Author)
  • Arne Ludwig - , Ruhr University Bochum (Author)
  • Hans Werner Becker - , Ruhr University Bochum (Author)
  • Andreas Dirk Wieck - , Ruhr University Bochum (Author)
  • Markus Grafen - , Ruhr University Bochum (Author)
  • Andreas Ostendorf - , Ruhr University Bochum (Author)
  • Anjana Devi - , Ruhr University Bochum (Author)

Abstract

Novel copper ketoiminate compounds were synthesized and for the first time applied for additive-free solution-based deposition of nanoscale copper oxide thin films. The two closely related compounds, namely the bis[4-(2-ethoxyethyl-imino)-3-pentanonato]copper, [Cu(EEKI)2], and bis[4-(3-methoxypropylimino)-3-pentanonato]copper, [Cu(MPKI)2], were characterized by means of elemental and thermogravimetric analysis (TGA), as well as electron impact mass spectrometry (EI-MS). The advantages of these compounds are that they are liquid and possess excellent solubility in common organic solvents in addition to an optimum reactivity towards ambient moisture that enables a facile solution-based approach to nanoscale copper oxide thin films. Moreover, no additives or aging is needed to stabilize the solution processing of the copper oxide layers. [Cu(MPKI)2] was tested in detail for the deposition of copper oxide thin films by spin coating. Upon one-step annealing, high-quality, uniform, crystalline copper oxide thin films were deposited on Si, SiO2, as well as on quartz substrates. Structural, morphological and compositional characteristics of the copper oxide nanostructures were investigated in detail by means of X-ray diffraction (XRD), scanning electron microscopy (SEM), Raman spectroscopy, X-ray photoelectron spectroscopy (XPS), and a combined analysis using Rutherford backscattering spectroscopy (RBS) and nuclear reaction analysis (NRA). It was possible to control the copper oxide phases (CuO and Cu2O) by systematic tuning of the post-deposition annealing conditions. The functional properties in terms of optical band gap were investigated using UV/Vis spectroscopy, while the transport properties, such as resistivity, mobility and carrier concentration were analyzed employing Hall measurements, which confirmed the p-type conductivity of the copper oxide layers.

Details

Original languageEnglish
Pages (from-to)2670-2679
Number of pages10
JournalDalton transactions
Volume46
Issue number8
Publication statusPublished - 2017
Peer-reviewedYes
Externally publishedYes

External IDs

PubMed 28170011

Keywords

ASJC Scopus subject areas