Statistical interpretation of autocorrelation coefficients for fields in mode-stirred chambers

Research output: Contribution to book/Conference proceedings/Anthology/ReportConference contributionContributedpeer-review

Contributors

  • H. G. Krauthäuser - , Chair of Electromagnetic Theory and Compatibility, Otto von Guericke University Magdeburg (Author)
  • T. Winzerling - , Otto von Guericke University Magdeburg (Author)
  • J. Nitsch - , Otto von Guericke University Magdeburg (Author)
  • N. Eulig - , Norddeutscher Rundfunk (Author)
  • A. Enders - , Technical University of Braunschweig (Author)

Abstract

The autocorrelation function of electrical field strengths for different boundary conditions (tuner positions) at a given spacial position is proposed in the IEC standard 61000-4-21 as a measure for the determination of the number of uncorrelated boundary conditions in mode-stirred chambers. Additionally, an upper limit for the autocorrelation coefficient is given for a fixed number N of measured tuner positions only. In this paper, we analyze an approach given in the literature that includes the treatment of different N, but still gives results that are inconsistent with the daily measurement practice in mode-stirred chambers. A slight modification of this approach is proposed that leads to consistent results. This paper gives critical values for the autocorrelation coefficients for any number of measured tuner positions based on a statistical analysis of the well known probability distribution of autocorrelation coefficients. The degree of determination and the significance level remain as free parameters that have to be established by the community. The authors propose values for these parameters that are consistent with the example given in the standard.

Details

Original languageEnglish
Title of host publication2005 International Symposium on Electromagnetic Compatibility, EMC 2005
Pages550-555
Number of pages6
Publication statusPublished - 2005
Peer-reviewedYes

Publication series

SeriesIEEE International Symposium on Electromagnetic Compatibility (EMC)
Volume2
ISSN2158-110X

Conference

Title2005 International Symposium on Electromagnetic Compatibility, EMC 2005
Duration8 - 12 August 2005
CityChicago, IL
CountryUnited States of America

External IDs

ORCID /0000-0002-3894-9831/work/142252670