Spin and orbital excitations through the metal-to-insulator transition in Cd2Os2O7 probed with high-resolution resonant inelastic x-ray scattering

Research output: Contribution to journalResearch articleContributedpeer-review

Contributors

  • J. G. Vale - , University College London, Swiss Federal Institute of Technology Lausanne (EPFL) (Author)
  • S. Calder - , Oak Ridge National Laboratory (Author)
  • N. A. Bogdanov - , Leibniz Institute for Solid State and Materials Research Dresden, Max Planck Institute for Solid State Research (Author)
  • C. Donnerer - , University College London (Author)
  • M. Moretti Sala - , European Synchrotron Radiation Facility (Author)
  • N. R. Davies - , University of Oxford (Author)
  • D. Mandrus - , University of Tennessee, Knoxville, Oak Ridge National Laboratory (Author)
  • J. Van Den Brink - , Chair of Solid State Theory, Leibniz Institute for Solid State and Materials Research Dresden (Author)
  • A. D. Christianson - , Oak Ridge National Laboratory, University of Tennessee, Knoxville (Author)
  • D. F. McMorrow - , University College London (Author)

Abstract

High-resolution resonant inelastic x-ray scattering measurements (ΔE=46meV) have been performed on Cd2Os2O7 through the metal-to-insulator transition (MIT). A magnetic excitation at 125 meV evolves continuously through the MIT, in agreement with recent Raman-scattering results, and provides further confirmation for an all-in all-out magnetic ground state. Asymmetry of this feature is likely a result of coupling between the electronic and the magnetic degrees of freedom. We also observe a broad continuum of interband excitations centered at 0.3 eV energy loss. This is indicative of significant hybridization between Os 5d and O 2p states and the concurrent itinerant nature of the system. In turn, this suggests a possible breakdown of the free-ion model for Cd2Os2O7.

Details

Original languageEnglish
Article number014441
JournalPhysical Review B
Volume101
Issue number1
Publication statusPublished - 27 Jan 2020
Peer-reviewedYes