Space-resolved in-plane moduli of graphene oxide and chemically derived graphene applying a simple wrinkling procedure

Research output: Contribution to journal › Research article › Contributed › peer-review

Contributors

  • Daniel A. Kunz - , University of Bayreuth (Author)
  • Patrick Feicht - , University of Bayreuth (Author)
  • Sebastian Gödrich - , University of Bayreuth (Author)
  • Herbert Thurn - , University of Bayreuth (Author)
  • Georg Papastavrou - , University of Bayreuth (Author)
  • Andreas Fery - , University of Bayreuth (Author)
  • Josef Breu - , University of Bayreuth (Author)

Abstract

Mapping the in-plane moduli: A simple wrinkling process on a deformable substrate requiring only readily available topographical atomic force microscopy (AFM) imaging allows space-resolved determination of the mechanical properties of single graphene oxide and chemically derived graphene sheets. The lateral resolution in the sub-micrometer range delivers unique insights into the defect distribution within the nanoplatelets.

Details

Original languageEnglish
Pages (from-to)1337-1341
Number of pages5
JournalAdvanced materials
Volume25
Issue number9
Publication statusPublished - 6 Mar 2013
Peer-reviewedYes
Externally publishedYes

Keywords

ASJC Scopus subject areas

Keywords

  • atomic force microscopy, graphene, mechanical properties, nanoplatelets, wrinkling

Library keywords