Descriptor‐based microstructure characterization plays a crucial role in the field of reversed material engineering for random heterogeneous media. With the advent of differentiable microstructure characterization and reconstruction, there has been a growing interest in the development of differentiable formulations of descriptors. The search for effective descriptors becomes indispensable to adequately characterize a wide range of microstructures. This work proposes a novel approach to construct a descriptor by utilizing a wavelet‐based transformation called the scattering transformation on microstructure images. The characterization and reconstruction capabilities of this newly developed descriptor are compared to a benchmark descriptor based on spatial correlation functions using various 2D microstructure images. The comparative analysis aims to evaluate the effectiveness and potential advantages of the proposed wavelet‐based descriptor.