Scattering transform in microstructure reconstruction

Research output: Contribution to journalResearch articleContributedpeer-review



Descriptor‐based microstructure characterization plays a crucial role in the field of reversed material engineering for random heterogeneous media. With the advent of differentiable microstructure characterization and reconstruction, there has been a growing interest in the development of differentiable formulations of descriptors. The search for effective descriptors becomes indispensable to adequately characterize a wide range of microstructures. This work proposes a novel approach to construct a descriptor by utilizing a wavelet‐based transformation called the scattering transformation on microstructure images. The characterization and reconstruction capabilities of this newly developed descriptor are compared to a benchmark descriptor based on spatial correlation functions using various 2D microstructure images. The comparative analysis aims to evaluate the effectiveness and potential advantages of the proposed wavelet‐based descriptor.


Original languageEnglish
Article numbere202300169
Issue number3
Publication statusPublished - 12 Sept 2023

External IDs

ORCID /0000-0003-3358-1545/work/142658537