Scanning force microscopy investigation of liquid structures and its application to fundamental wetting research

Research output: Contribution to journalResearch articleContributedpeer-review

Contributors

  • S. Herminghaus - , Ulm University (Author)
  • T. Pompe - , Max Planck Institute of Colloids and Interfaces (Author)
  • A. Fery - , Max Planck Institute of Colloids and Interfaces (Author)

Abstract

The possibility of determining the topography of liquid profiles by scanning force microscopy (SFM) in tapping mode is discussed in detail as to its possible mechanism and accuracy. Applications of this technique to the investigation of contact line tensions and effective interface potentials are presented. Two complementary methods, both based on SFM of the liquid topography, are demonstrated for determining contact line tensions. The values obtained are within the theoretically expected range.

Details

Original languageEnglish
Pages (from-to)1767-1782
Number of pages16
Journal Journal of adhesion science and technology : the international journal of theoretical and basic aspects of adhesion science and its applications in all areas of technology
Volume14
Issue number14
Publication statusPublished - 2000
Peer-reviewedYes
Externally publishedYes

Keywords

Keywords

  • line tension, Scanning force microscopy, wetting

Library keywords