Scanning force microscopy investigation of liquid structures and its application to fundamental wetting research
Research output: Contribution to journal › Research article › Contributed › peer-review
Contributors
Abstract
The possibility of determining the topography of liquid profiles by scanning force microscopy (SFM) in tapping mode is discussed in detail as to its possible mechanism and accuracy. Applications of this technique to the investigation of contact line tensions and effective interface potentials are presented. Two complementary methods, both based on SFM of the liquid topography, are demonstrated for determining contact line tensions. The values obtained are within the theoretically expected range.
Details
Original language | English |
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Pages (from-to) | 1767-1782 |
Number of pages | 16 |
Journal | Journal of adhesion science and technology : the international journal of theoretical and basic aspects of adhesion science and its applications in all areas of technology |
Volume | 14 |
Issue number | 14 |
Publication status | Published - 2000 |
Peer-reviewed | Yes |
Externally published | Yes |
Keywords
ASJC Scopus subject areas
Keywords
- line tension, Scanning force microscopy, wetting