Press- and Shrink-fit Connections with Cylindrical Aluminum Conductors for High-current Applications Contact- and Long-term Behavior Depending on Mechanical Parameters

Research output: Contribution to book/Conference proceedings/Anthology/ReportConference contributionContributedpeer-review

Contributors

Details

Original languageEnglish
Title of host publication2021 IEEE SIXTY-SIXTH HOLM CONFERENCE ON ELECTRICAL CONTACTS (HLM)
Pages271-278
Publication statusPublished - 2017
Peer-reviewedYes

External IDs

Scopus 85039162571
ORCID /0000-0002-4793-8800/work/150330512

Keywords

Keywords

  • electrical connections, high-current devices, press fit, shrink-fit, mechanical stress, gas insulated switchgear