Photoluminescence dynamics in few-layer InSe

Research output: Contribution to journalResearch articleContributedpeer-review

Contributors

  • Tommaso Venanzi - , Chair of Semiconductor Spectroscopy, Helmholtz-Zentrum Dresden-Rossendorf (HZDR) (Author)
  • Himani Arora - , Faculty of Physics, Helmholtz-Zentrum Dresden-Rossendorf (HZDR) (Author)
  • Stephan Winnerl - , Helmholtz-Zentrum Dresden-Rossendorf (HZDR) (Author)
  • Alexej Pashkin - , Helmholtz-Zentrum Dresden-Rossendorf (HZDR) (Author)
  • Phanish Chava - , Chair of Nanoelectronics, Helmholtz-Zentrum Dresden-Rossendorf (HZDR) (Author)
  • Amalia Patanè - , University of Nottingham (Author)
  • Zakhar D. Kovalyuk - , NASU - Institute for Problems of Materials Science (Author)
  • Zakhar R. Kudrynskyi - , University of Nottingham (Author)
  • Kenji Watanabe - , National Institute for Materials Science Tsukuba (Author)
  • Takashi Taniguchi - , National Institute for Materials Science Tsukuba (Author)
  • Artur Erbe - , Helmholtz-Zentrum Dresden-Rossendorf (HZDR) (Author)
  • Manfred Helm - , Chair of Semiconductor Spectroscopy, Helmholtz-Zentrum Dresden-Rossendorf (HZDR) (Author)
  • Harald Schneider - , Helmholtz-Zentrum Dresden-Rossendorf (HZDR) (Author)

Abstract

We study the optical properties of thin flakes of InSe encapsulated in hexagonal boron nitride. More specifically, we investigate the photoluminescence (PL) emission and its dependence on sample thickness and temperature. Through the analysis of the PL line shape, we discuss the relative weights of the exciton and electron-hole contributions. Thereafter we investigate the PL dynamics. Two contributions are distinguishable at low temperature: direct band-gap electron-hole and defect-assisted recombination. The two recombination processes have lifetimes of τ1∼8ns and τ2∼100ns, respectively. The relative weights of the direct band-gap and defect-assisted contributions show a strong layer dependence due to the direct-to-indirect band-gap crossover. Electron-hole PL lifetime is limited by population transfer to lower-energy states and no dependence on the number of layers was observed. The lifetime of the defect-assisted recombination gets longer for thinner samples. Finally, we show that the PL lifetime decreases at high temperatures as a consequence of more efficient nonradiative recombinations.

Details

Original languageEnglish
Article number044001
JournalPhysical review materials
Volume4
Issue number4
Publication statusPublished - Apr 2020
Peer-reviewedYes