On the fault-injection-caused increase of the DAE-Index in analogue fault simulation

Research output: Contribution to book/conference proceedings/anthology/report › Conference contribution › Contributed › peer-review

Contributors

Details

Original languageUndefined
Title of host publicationProceedings - European Test Workshop 1999, ETW 1999
Pages118-122
Publication statusPublished - 1999
Peer-reviewedYes

External IDs

Scopus 84992265622

Keywords

DFG Classification of Subject Areas according to Review Boards