New Approach for Monitoring a Direct Laser Interference Patterning Process Using a Combination of an Infrared Camera and a Diffraction Measurement System
Research output: Contribution to journal › Research article › Contributed › peer-review
Contributors
Abstract
Recently, process monitoring emerges as a breakthrough technology in industrial laser machines applications to enhance process stability and economic efficiency while ensuring high-quality pro-cessing parts and significantly reducing scrap rate. Furthermore, the latest advances in monitoring systems open a broad range of new opportunities to increase the capabilities of laser surface structur-ing. In this study, stainless steel and aluminum substrates are structured with a line-like geometry by Direct Laser Interference Patterning. A high-speed infrared camera is used to detect the thermal effects throughout the laser process. Simultaneously, a diffraction measurement system is implemented to analyze the quality of the fabricated periodic patterns by comparing the diffraction order characteris-tics. This specific combination of the systems allows a remarkably high-performance process moni-toring and quality assurance. The obtained results reveal a correlation between the signals detected by the infrared camera and the intensity of the diffraction orders recorded with the quality of the surface reached.
Details
| Original language | English |
|---|---|
| Pages (from-to) | 130-137 |
| Number of pages | 8 |
| Journal | Journal of laser micro nanoengineering |
| Volume | 16 |
| Issue number | 2 |
| Publication status | Published - Oct 2021 |
| Peer-reviewed | Yes |
External IDs
| Scopus | 85119470501 |
|---|---|
| ORCID | /0000-0003-4333-4636/work/196675429 |
Keywords
Keywords
- Aluminum, Diffraction, Direct laser interference patterning, Dlip, Heat accumulation, Infrared camera, Moni-toring, Pulsed laser, Scatterometry, Stainless steel