Multi-scale textured PEEK surfaces obtained by direct laser interference patterning using IR ultra-short pulses

Research output: Contribution to journalResearch articleContributedpeer-review

Contributors

Abstract

In this work, we aimed at getting the first insight into the influence of the laser processing parameters on the production of functional multi-scale PEEK surfaces using the Direct Laser Interference Patterning technology. An infrared ultra-short pulsed laser source (1064 nm, 10 ps) and a two-beam interference setup were used. The fabricated structures morphology was analyzed by Scanning Electron Microscopy and Confocal Microscopy. As a result, line-like structures with periodic spatial repetition (p) at two levels were produced: main structures with p = 5 µm and mean depth values up to ∼2.5 µm (aspect ratio of ∼0.5) and secondary structures, perpendicularly oriented relative to the main structures, formed at DLIP maxima position (top part of ridges) with p ≈ 1 µm (LIPSS).

Details

Original languageEnglish
Article number134091
JournalMaterials letters
Volume339
Publication statusPublished - May 2023
Peer-reviewedYes

External IDs

Scopus 85149264621

Keywords

Keywords

  • Direct Laser Interference Patterning, PEEK, Surface micro structuring, Ultra-short pulsed laser