Modular 100kA Surge Current Source with Programmable Current Shape
Research output: Contribution to journal › Letter › Contributed
Contributors
Abstract
The often cited I2t value describes a power semiconductor’s ability to withstand surge current events. However, the dependency on current shape is usually overlooked. This article gives a short introduction to a surge current tester with arbitrary output current waveform and exceptionally low output current ripple, which enables a wide range of surge current tests.
Details
Original language | English |
---|---|
Pages (from-to) | 40-41 |
Number of pages | 2 |
Journal | Bodo's power systems : electronics in motion and conversion |
Volume | 2024 |
Issue number | 8 |
Publication status | Published - 1 Aug 2024 |
Peer-reviewed | No |
External IDs
ORCID | /0000-0003-0153-148X/work/165451699 |
---|---|
ORCID | /0000-0002-8167-4589/work/165454535 |