Lurking in the Shadows: Challenges for X-Ray Inspection to Uncover Electromigration-Based Hardware Trojans in Advanced Packaging

Research output: Contribution to conferences › Paper › Contributed › peer-review

Contributors

Katayoon Yahyaei - , University of Florida (Author)
Susann Rothe - , Chair of Development and Construction in Electromechanical and Electronic Design (Author)
Mahmood Vawoo Dawood Naina - , New York University Abu Dhabi (Author)
Antika Roy - , University of Florida (Author)
Mohammad Shafkat M. Khan - , University of Florida (Author)
Ozgur Sinanoglu - , New York University Abu Dhabi (Author)
Jens Lienig - , Chair of Development and Construction in Electromechanical and Electronic Design (Author)
Johann Knechtel - , New York University Abu Dhabi (Author)
Navid Asadizanjani - , University of Florida (Author)

Best Paper Nominee

Title	IEEE International conference on Physical Assurance and Inspection of Electronics 2025
Abbreviated title	PAINE 2025
Duration	14 - 16 October 2025
Website	https://paine-conference.org/
Degree of recognition	International event
Location	The Marriot Westminster
City	Denver
Country	United States of America