Investigation of carrier recombination and device stability in phosphorescent and TADF OLEDs

Research output: Contribution to book/Conference proceedings/Anthology/ReportConference contributionContributedpeer-review

Contributors

Abstract

This presentation will discuss both a detailed investigation of the charge carrier recombination in state-of-the-art OLEDs and an engineering route to increase device lifetime and efficiency by forming so-called ultrastable glass layers. For the latter, both phosphorescent and TADF OLEDs are presented.

Details

Original languageEnglish
Title of host publication26th International Display Workshops, IDW 2019
PublisherInternational Display Workshops
Pages806-808
Number of pages3
ISBN (electronic)9781713806301
Publication statusPublished - 2019
Peer-reviewedYes

Publication series

SeriesProceedings of the International Display Workshops
Volume2
ISSN2436-0252

Conference

Title26th International Display Workshops, IDW 2019
Duration27 - 29 November 2019
CitySapporo
CountryJapan

External IDs

ORCID /0000-0002-4112-6991/work/142254760

Keywords

Keywords

  • Organic light-emitting diodes, Phosphorescence, Recombination, Stability, TADF