Investigation of a novel approach for the cross-linking characterization of SU-8 photoresist materials by means of optical dispersion measurements

Research output: Contribution to book/conference proceedings/anthology/reportConference contributionContributedpeer-review

Contributors

Details

Original languageEnglish
Title of host publicationReliability, Packaging, Testing, and Characterization of MOEMS/MEMS, Nanodevices, and Nanomaterials XIII
Publication statusPublished - 2014
Peer-reviewedYes

Publication series

SeriesProceedings of SPIE
Volume8975
ISSN0277-786X

External IDs

Scopus 84900502632

Keywords