Guidelines for accurate evaluation of photodetectors based on emerging semiconductor technologies

Research output: Contribution to journalResearch articleContributedpeer-review

Contributors

  • Collaborators - (Author)
  • Dresden Integrated Center for Applied Physics and Photonics Materials (DC-IAPP)
  • Chair of Opto-Electronics
  • Simon Fraser University
  • University of Manchester
  • Swansea University
  • VS Technology
  • Italian Institute of Technology
  • Spanish National Research Council (CSIC)
  • Nankai University
  • Pohang University of Science and Technology
  • Fudan University
  • Thorlabs, Inc.
  • OmniVision Technologies Inc.
  • Eindhoven University of Technology
  • Holst Centre
  • Vishay Semiconductor GmbH
  • The University of Chicago
  • Lumiense Photonics Inc.
  • Karlsruhe Institute of Technology
  • InnovationLab GmbH
  • Northwestern University
  • Université de Bordeaux
  • City University of Hong Kong
  • Yonsei University
  • ICFO - Institute of Photonic Sciences
  • ICREA - Catalan Institution for Research and Advanced Studies
  • University College London
  • RWTH Aachen University
  • AMO GmbH
  • Sorbonne Université
  • University of Ioannina
  • University of Groningen
  • Interuniversitair Micro-Elektronica Centrum
  • Exosens Group
  • Vienna University of Technology
  • Polytechnic University of Milan
  • University of California at San Diego
  • University of California at Santa Barbara
  • Chung-Ang University
  • Peking University
  • University of Strasbourg
  • University of Toronto
  • Jilin University
  • Panasonic Corporation
  • Swiss Federal Laboratories for Materials Science and Technology (Empa)
  • Queensland University of Technology
  • University of Cambridge
  • Siemens AG
  • Hasselt University
  • Photon etc.
  • Royal Melbourne Institute of Technology University

Abstract

Photodetector technologies based on emerging semiconductors—for example, organic semiconductors, halide perovskites, quantum dots, low-dimensional semiconductors and metal oxides—hold considerable promise for next-generation optoelectronics. However, the breadth and multidisciplinarity of this field, alongside its diverse range of applications, have resulted in inconsistent performance characterization and reporting practices, hindering the effective benchmarking of these technologies. Here we present a consensus among researchers from academia and industry on accurately capturing the key performance metrics of photodetectors based on emerging semiconductors and utilizing the photoelectric effect. We analyse their underlying assumptions, discuss common misunderstandings, and provide guidelines for accurate characterization and reporting. Additionally, we discuss the benchmarking of these photodetector technologies with respect to diverse applications. We expect that these comprehensive guidelines for characterization, reporting and benchmarking will accelerate and streamline further advancements in the field, propelling emerging photodetector technologies towards their full potential.

Details

Original languageEnglish
Pages (from-to)1178-1188
Number of pages11
JournalNature Photonics
Volume19
Issue number11
Publication statusPublished - Nov 2025
Peer-reviewedYes