Femtosecond time-resolved MeV electron diffraction
Research output: Contribution to journal › Research article › Contributed › peer-review
Contributors
Abstract
We report the experimental demonstration of femtosecond electron diffraction using high-brightness MeV electron beams. High-quality, single-shot electron diffraction patterns for both polycrystalline aluminum and single-crystal 1T-TaS2 are obtained utilizing a 5 fC (∼3 × 104 electrons) pulse of electrons at 2.8 MeV. The high quality of the electron diffraction patterns confirms that electron beam has a normalized emittance of ∼50 nm rad. The transverse and longitudinal coherence length is ∼11 and ∼2.5 nm, respectively. The timing jitter between the pump laser and probe electron beam was found to be ∼100 fs (rms). The temporal resolution is demonstrated by observing the evolution of Bragg and superlattice peaks of 1T-TaS2 following an 800 nm optical pump and was found to be 130 fs. Our results demonstrate the advantages of MeV electrons, including large elastic differential scattering cross-section and access to high-order reflections, and the feasibility of ultimately realizing below 10 fs time-resolved electron diffraction.
Details
Original language | English |
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Article number | 063004 |
Pages (from-to) | 1-6 |
Number of pages | 6 |
Journal | New journal of physics |
Volume | 17 |
Issue number | 6 |
Publication status | E-pub ahead of print - 2 Jun 2015 |
Peer-reviewed | Yes |
Externally published | Yes |
External IDs
ORCID | /0000-0002-2438-0672/work/158767770 |
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Keywords
ASJC Scopus subject areas
Keywords
- coherent length, high-brightness electron beam, ultrafast electron diffraction, ultrafast electron imaging