ESD and transient protection of microwave semiconductor devices and integrated circuits based on field emitter structures

Research output: Contribution to journalResearch articleContributedpeer-review

Contributors

  • K. Bock - , Technische Universität Darmstadt (Author)
  • H. L. Hartnagel - , Technische Universität Darmstadt (Author)

Abstract

On the basis of investigations regarding the electrostatic discharge (ESD) sensitivity of GaAs microwave devices, we found that there is a need for protection circuits to prevent ESD degradation or destruction of microwave semiconductor devices and circuits. Since such protection circuits are not yet available for these frequency ranges, we developed a suitable protection concept. The field emission effect showed the qualities needed, and we developed metal and GaAs field emitters to fabricate very fast switches with the ability to handle very high current densities in order to obtain such protection circuits suitable for operation in the microwave frequency range.

Details

Original languageEnglish
Pages (from-to)69-74
Number of pages6
JournalMicroelectronics Journal
Volume25
Issue number1
Publication statusPublished - Feb 1994
Peer-reviewedYes
Externally publishedYes

External IDs

ORCID /0000-0002-0757-3325/work/139064990