ESD and transient protection of microwave semiconductor devices and integrated circuits based on field emitter structures
Research output: Contribution to journal › Research article › Contributed › peer-review
Contributors
Abstract
On the basis of investigations regarding the electrostatic discharge (ESD) sensitivity of GaAs microwave devices, we found that there is a need for protection circuits to prevent ESD degradation or destruction of microwave semiconductor devices and circuits. Since such protection circuits are not yet available for these frequency ranges, we developed a suitable protection concept. The field emission effect showed the qualities needed, and we developed metal and GaAs field emitters to fabricate very fast switches with the ability to handle very high current densities in order to obtain such protection circuits suitable for operation in the microwave frequency range.
Details
Original language | English |
---|---|
Pages (from-to) | 69-74 |
Number of pages | 6 |
Journal | Microelectronics Journal |
Volume | 25 |
Issue number | 1 |
Publication status | Published - Feb 1994 |
Peer-reviewed | Yes |
Externally published | Yes |
External IDs
ORCID | /0000-0002-0757-3325/work/139064990 |
---|