Electronic properties of self-assembled rare-earth silicide nanowires on Si(001)

Research output: Contribution to journalResearch articleContributedpeer-review

Contributors

  • Martina Wanke - , Technical University of Berlin, University Hospital at the Friedrich-Alexander University Erlangen-Nürnberg (Author)
  • Karolin Loeser - , Technical University of Berlin (Author)
  • Gerhard Pruskil - , Technical University of Berlin (Author)
  • Denis V. Vyalikh - , Chair of Surface Physics (Author)
  • Serguei L. Molodtsov - , TUD Dresden University of Technology, European XFEL (Author)
  • Steffen Danzenbaecher - , Chair of Surface Physics (Author)
  • Clemens Laubschat - , Chair of Surface Physics (Author)
  • Mario Daehne - , Technical University of Berlin (Author)

Abstract

To study the formation and the electronic properties of self-assembled dysprosium and erbium silicide nanowires on the vicinal Si(001) surface, we applied scanning tunneling microscopy and angle-resolved photoelectron spectroscopy. The formation of different types of nanowires was found, depending on the rare-earth exposure, postgrowth annealing temperature, and the rare-earth material itself. It is demonstrated that the so-called thin dysprosium silicide nanowires, which form close-packed arrays, are characterized by a nonmetallic band structure with negligible dispersion. In contrast to that, the so-called broad dysprosium silicide nanowires, which are lateral distances of several tens of nanometers apart, are metallic with one-dimensional electronlike bands crossing the Fermi energy. The effective masses of these bands amount to values ranging from 0.2 to 1.1 free-electron masses, and the overall band filling was found to be close to 1. It is shown that broad erbium silicide nanowires have a very similar electronic band structure compared to broad dysprosium silicide nanowires, while corresponding thin erbium silicide nanowires could not be found.

Details

Original languageEnglish
Article number205417
Number of pages11
JournalPhysical Review B
Volume83
Issue number20
Publication statusPublished - 19 May 2011
Peer-reviewedYes

External IDs

Scopus 79961109513

Keywords