Effects of odd-even side chain length of alkyl-substituted diphenylbithiophenes on first monolayer thin film packing structure

Research output: Contribution to journalResearch articleContributedpeer-review

Contributors

  • Hylke B. Akkerman - , Stanford University, Holst Centre (Author)
  • Stefan C.B. Mannsfeld - , Stanford University, SLAC National Accelerator Laboratory (Author)
  • Ananth P. Kaushik - , Cornell University (Author)
  • Eric Verploegen - , Stanford University (Author)
  • Luc Burnier - , Cornell University (Author)
  • Arjan P. Zoombelt - , Stanford University (Author)
  • Jonathan D. Saathoff - , Cornell University (Author)
  • Sanghyun Hong - , Stanford University, Samsung (Author)
  • Sule Atahan-Evrenk - , Harvard University (Author)
  • Xueliang Liu - , Harvard University (Author)
  • Alán Aspuru-Guzik - , Harvard University (Author)
  • Michael F. Toney - , Stanford University (Author)
  • Paulette Clancy - , Cornell University (Author)
  • Zhenan Bao - , Stanford University (Author)

Abstract

Because of their preferential two-dimensional layer-by-layer growth in thin films, 5,5′bis(4-alkylphenyl)-2,2′-bithiophenes (P2TPs) are model compounds for studying the effects of systematic chemical structure variations on thin-film structure and morphology, which in turn, impact the charge transport in organic field-effect transistors. For the first time, we observed, by grazing incidence X-ray diffraction (GIXD), a strong change in molecular tilt angle in a monolayer of P2TP, depending on whether the alkyl chain on the P2TP molecules was of odd or even length. The monolayers were deposited on densely packed ultrasmooth self-assembled alkane silane modified SiO2 surfaces. Our work shows that a subtle change in molecular structure can have a significant impact on the molecular packing structure in thin film, which in turn, will have a strong impact on charge transport of organic semiconductors. This was verified by quantum-chemical calculations that predict a corresponding odd-even effect in the strength of the intermolecular electronic coupling.

Details

Original languageEnglish
Pages (from-to)11006-11014
Number of pages9
JournalJournal of the American Chemical Society
Volume135
Issue number30
Publication statusPublished - 31 Jul 2013
Peer-reviewedYes
Externally publishedYes