Direct measurement of the temperature dependent lattice and electronic structure reconfigurations of α-RuCl3 thin films

Research output: Contribution to journal › Research article › Contributed › peer-review

Contributors

  • Peixuan Ji - , Tianjin University (Author)
  • Jin Chen - , Tianjin University (Author)
  • Jiapeng Wang - , Tianjin University (Author)
  • Liangpeng Hou - , Tianjin University (Author)
  • Huihui Liang - , Tianjin University (Author)
  • Jiaying Duan - , Tianjin University (Author)
  • Xiaochen Hong - , Leibniz Institute for Solid State and Materials Research Dresden, University of Wuppertal (Author)
  • Xi Chen - , Tianjin University (Author)
  • Zhixin Hu - , Tianjin University (Author)
  • Bernd Büchner - , Leibniz Institute for Solid State and Materials Research Dresden (Author)
  • Xiaosong Wu - , Peking University (Author)
  • Yanqing Ma - , Tianjin University, Tianjin Key laboratory for Low-dimensional Electronic Materials and Advanced Instrumentation (Author)
  • Zhixiang Sun - , Tianjin University (Author)
  • Lei Ma - , Tianjin University (Author)

Abstract

Herein, we reveal the temperature-dependent broadening of the Mott gap in layered α-RuCl3, together with a distinct transition in the range of 100–130 K, through surface morphology and electronic structure characterizations using scanning tunneling microscopy and scanning tunneling spectroscopy, respectively. Furthermore, layer-dependent measurements indicate an enhanced phase transition and Kitaev interactions with decreasing thickness. These results show that low-dimensional α-RuCl3 films differ from their bulk state owing to their unique structural and electronic properties, providing an ideal model platform for exploring Kitaev physics.

Details

Original languageEnglish
Pages (from-to)19582-19587
Number of pages6
JournalPhysical Chemistry Chemical Physics
Volume28
Issue number32
Publication statusPublished - 19 Aug 2026
Peer-reviewedYes
Externally publishedYes

External IDs

PubMed 42530370