Design technologies for nanoelectronic systems beyond ultimately scaled CMOS

Research output: Contribution to book/conference proceedings/anthology/reportChapter in book/anthology/reportInvited

Contributors

  • Haykel Ben Jamaa - , Swiss Federal Institute of Technology Lausanne (EPFL) (Author)
  • Bahman Kheradmand Boroujeni - , Swiss Federal Institute of Technology Lausanne (EPFL) (Author)
  • Giovanni De Micheli - , Swiss Federal Institute of Technology Lausanne (EPFL) (Author)
  • Yusuf Leblebici - , Swiss Federal Institute of Technology Lausanne (EPFL) (Author)
  • Christian Piguet - , Swiss Center for Electronics and Microtechnology (CSEM) (Author)
  • Alexandre Schmid - , Swiss Federal Institute of Technology Lausanne (EPFL) (Author)
  • Milos Stanisavljevic - , Swiss Federal Institute of Technology Lausanne (EPFL) (Author)

Abstract

As already explained in the introduction to Chap. , the development of economically feasible nanoelectronic systems requires a tight interplay between materials and fabrication technologies on the one hand and design technologies on the other. In particular, it is quite essential to explore circuit-level measures to mitigate the limitations of process variations (PVs), leakage, and reduced device reliability and, finally, to explore system-level design approaches that are better adapted to the constraints imposed by the materials, technology, and device physics. This chapter largely deals with some of these key questions that relate to design technologies for nanoelectronic systems.

Details

Original languageEnglish
Title of host publicationNanosystems Design and Technology
PublisherSpringer, Boston [u. a.]
Pages45-84
ISBN (electronic)978-1-4419-0255-9
ISBN (print)978-1-4419-0254-2
Publication statusPublished - 21 May 2009
Peer-reviewedNo
Externally publishedYes

External IDs

Scopus 84889979310

Keywords