Dephasing in Ge/SiGe quantum wells measured by means of coherent oscillations

K. Kolata; N. S. Köster; A. Chernikov; M. J. Drexler; E. Gatti; S. Cecci; D. Chrastina; G. Isella; M. Guzzi; S. Chatterjee

doi:10.1103/PhysRevB.86.201303

Dephasing in Ge/SiGe quantum wells measured by means of coherent oscillations

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Contributors

K. Kolata - , University of Marburg (Author)
N. S. Köster - , University of Marburg (Author)
A. Chernikov - , University of Marburg (Author)
M. J. Drexler - , University of Marburg (Author)
E. Gatti - , University of Milan - Bicocca (Author)
S. Cecci - , Polytechnic University of Milan (Author)
D. Chrastina - , Polytechnic University of Milan (Author)
G. Isella - , Polytechnic University of Milan (Author)
M. Guzzi - , University of Milan - Bicocca (Author)
S. Chatterjee - , University of Marburg (Author)

Abstract

We present a dephasing time analysis of the excitonic resonances in Ge/SiGe quantum wells for various lattice temperatures by coherent oscillation spectroscopy (COS). The results are compared to the linewidths of the excitonic resonances determined from linear absorption measurements. Additionally, COS is applied to different samples with varying linewidth, identifying one sample with a dominating homogeneously broadened 1s excitonic resonance down to 7 K.

Details

Original language	English
Article number	201303
Journal	Physical Review B - Condensed Matter and Materials Physics
Volume	86
Issue number	20
Publication status	Published - 30 Nov 2012
Peer-reviewed	Yes
Externally published	Yes

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Dephasing in Ge/SiGe quantum wells measured by means of coherent oscillations

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Erratum: Dephasing in Ge/SiGe quantum wells measured by means of coherent oscillations (Physical Review B (2012) 86 (201303(R)) DOI:10.1103/PhysRevB.86.201303)