Characterization and nanoindentation testing of thin ZrO 2 films synthesized using layer-by-layer (LbL) deposited organic templates

Research output: Contribution to journalResearch articleContributedpeer-review

Contributors

  • I. Zlotnikov - , Multi-scale Analysis (Junior Research Group), Technion-Israel Institute of Technology (Author)
  • I. Gotman - , Technion-Israel Institute of Technology (Author)
  • E. Y. Gutmanas - , Technion-Israel Institute of Technology (Author)

Abstract

Thin organic LbL (layer-by-layer) films with negatively charged surface were used as templates for biomimetic deposition of ZrO 2 on Si wafers by hydrolysis of Zr(SO 4 ) 2 solution. The as-deposited ceramic layers were fully amorphous and were composed of the mixture of zirconia and zirconium sulfate. During transmission electron microscopy (TEM) examination, the amorphous ZrO 2 crystallized almost instantaneously to tetragonal (t) ZrO 2 under the electron beam. The ≤110 nm thick as-deposited layers were crack-free and adhered well to the LbL surface. Annealing at 500 °C led to complete crystallization of amorphous ZrO 2 to nanocrystalline t-ZrO 2 . Further heating to 900 °C resulted in transformation to monoclinic ZrO 2 , complete removal of sulfur and twofold shrinkage of the ceramic layer thickness. Both the nanohardness and elastic modulus of the deposited zirconia layers were significantly improved following the heat treatments.

Details

Original languageEnglish
Pages (from-to)3447-3453
Number of pages7
JournalApplied surface science : a journal devoted to applied physics and chemistry of surfaces and interfaces
Volume255
Issue number5 Pt. 2
Publication statusPublished - 30 Dec 2008
Peer-reviewedYes

Keywords

Keywords

  • Layer-by-layer deposition, Nanoindentation, Transmission electron microscopy (TEM), ZrO thin film