Capturing the complex physics behind universal grain size distributions in thin metallic films
Research output: Contribution to journal › Research article › Contributed › peer-review
Contributors
Abstract
Grain growth experiments on thin metallic films have shown the geometric and topological characteristics of the grain structure to be universal and independent of many experimental conditions. The universal size distribution, however, is found to differ both qualitatively and quantitatively from the standard Mullins curvature driven model of grain growth; with the experiments exhibiting an excess of small grains (termed an "ear") and an excess of very large grains (termed a "tail") compared with the model. While a plethora of extensions of the Mullins model have been proposed to explain these characteristics, none have been successful. In this work, large scale simulations of a model that resolves the atomic scale on diffusive time scales, the phase field crystal model, is used to examine the complex phenomena of grain growth. The results are in remarkable agreement with the experimental results, recovering the characteristic "ear" and "tail" features of the experimental grain size distribution. The simulations also indicate that while the geometric and topological characteristics are universal, the dynamic growth exponent is not.
Details
Original language | English |
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Pages (from-to) | 72-77 |
Number of pages | 6 |
Journal | Acta Materialia |
Volume | 64 |
Publication status | Published - 15 Apr 2013 |
Peer-reviewed | Yes |
External IDs
Scopus | 84890290475 |
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ArXiv | http://arxiv.org/abs/1304.4050v1 |
Keywords
DFG Classification of Subject Areas according to Review Boards
Keywords
- Grain growth, Phase field crystal, Size distribution, Scaling law