A Review of Techniques for Ageing Detection and Monitoring on Embedded Systems

Research output: Preprint/documentation/reportPreprint

Contributors

  • Leandro Lanzieri - , Hamburg University of Applied Sciences, German Electron Synchrotron (DESY) (Author)
  • Gianluca Martino - , Hamburg University of Technology (Author)
  • Goerschwin Fey - , Hamburg University of Technology (Author)
  • Holger Schlarb - , German Electron Synchrotron (DESY) (Author)
  • Thomas C. Schmidt - , Hamburg University of Applied Sciences (Author)
  • Matthias Wählisch - , Chair of Distributed and Networked Systems (Author)

Abstract

Embedded digital devices, such as Field-Programmable Gate Arrays (FPGAs) and Systems on Chip (SoCs), are increasingly used in dependable or safety-critical systems. These commodity devices are subject to notable hardware ageing, which makes failures likely when used for an extended time. It is of vital importance to understand ageing processes and to detect hardware degradations early. In this survey, we describe the fundamental ageing mechanisms and review the main techniques for detecting ageing in FPGAs, microcontrollers, SoCs, and power supplies. The main goal of this work is to facilitate future research efforts in this field by presenting all main approaches in an organized way.

Details

Original languageEnglish
Volumeabs/2301.06804
Publication statusPublished - 17 Jan 2023
No renderer: customAssociatesEventsRenderPortal,dk.atira.pure.api.shared.model.researchoutput.WorkingPaper

External IDs

dblp journals/corr/abs-2301-06804
ORCID /0000-0002-3825-2807/work/142659335

Keywords

Research priority areas of TU Dresden

DFG Classification of Subject Areas according to Review Boards

Keywords

  • cs.AR, cs.SY, eess.SY