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Technical Digest / International Electron Devices Meeting (IEDM)

ISSNs: 0163-1918, 2156-017X

IEEE, New York [u. a.]

Scopus rating (2022): CiteScore 5.8 SJR 1.017 SNIP 1.152

Journal

Titles
  • Technical Digest / International Electron Devices Meeting (IEDM)
  • Technical Digest - International Electron Devices Meeting, IEDM
Additional searchable titlesIEDM technical digest, IEDM, Technical Digest - International Electron Devices Meeting, IEEE International Electron Devices Meeting
ISSNs0163-1918, 2156-017X
PublisherIEEE, New York [u. a.]
ZDB-ID627323-3

Keywords

ASJC Scopus subject areas

Library keywords