Wire resistance impact and compensation methods in analog switching 1R memristive crossbar arrays

Publikation: Beitrag in FachzeitschriftForschungsartikelBeigetragenBegutachtung

Beitragende

Abstract

This paper discusses the integration of a highly scalable and interfacial switching, multi-bit Ti/Al2O3/NbOx/Ti bi-layer memristor stack in the 3 × 3 passive crossbar array. In conjunction with wire resistance, impact and methodologies are discussed to enhance voltage delivery for effective two-bit vector matrix multiplication. Finally, parameter tuning strategies for dynamic program and erase of the cells by pulsed VDD/2 and VDD/3 schemes to realize multi-bit vector matrix multiplication are presented.

Details

OriginalspracheEnglisch
Aufsatznummer109381
Seitenumfang6
FachzeitschriftSolid-state electronics
Jahrgang236
PublikationsstatusVeröffentlicht - Okt. 2026
Peer-Review-StatusJa

Externe IDs

ORCID /0000-0001-7436-0103/work/216552748
ORCID /0000-0003-3814-0378/work/216556491
ORCID /0000-0003-3259-4571/work/216556631

Schlagworte

Schlagwörter

  • 1R crossbar array, Analog switching, Dynamic measurements, Interfacial switching, Memristor, VMM, Wire resistance