Wire resistance impact and compensation methods in analog switching 1R memristive crossbar arrays
Publikation: Beitrag in Fachzeitschrift › Forschungsartikel › Beigetragen › Begutachtung
Beitragende
Abstract
This paper discusses the integration of a highly scalable and interfacial switching, multi-bit Ti/Al2O3/NbOx/Ti bi-layer memristor stack in the 3 × 3 passive crossbar array. In conjunction with wire resistance, impact and methodologies are discussed to enhance voltage delivery for effective two-bit vector matrix multiplication. Finally, parameter tuning strategies for dynamic program and erase of the cells by pulsed VDD/2 and VDD/3 schemes to realize multi-bit vector matrix multiplication are presented.
Details
| Originalsprache | Englisch |
|---|---|
| Aufsatznummer | 109381 |
| Fachzeitschrift | Solid-state electronics |
| Jahrgang | 236 |
| Publikationsstatus | Veröffentlicht - Okt. 2026 |
| Peer-Review-Status | Ja |
Schlagworte
ASJC Scopus Sachgebiete
Schlagwörter
- 1R crossbar array, Analog switching, Dynamic measurements, Interfacial switching, Memristor, VMM, Wire resistance