Imaging with THz radiation at nanoscale resolution is highly desirable for specific\nmaterial investigations that cannot be obtained in other parts of the electromagnetic\nspectrum. Nevertheless, classical free-space focusing of THz waves is limited to a\n>100 μm spatial resolution, due to the di↵raction limit. However, the scatteringtype\nscanning near-field optical microscopy (s-SNOM) promises to break this di↵raction\nbarrier. In this work, the realization of s-SNOM and spectroscopy for the THz\nspectral region from 30–300 μm (1–10 THz) is presented.\nThis has been accomplished by using two inherently di↵erent radiation sources at\ndistinct experimental setups: A femtosecond laser driven photoconductive antenna,\nemitting pulsed broadband THz radiation from 0.2–2 THz and a free-electron laser\n(FEL) as narrow-band high-intensity source, tunable from 1.3–10 THz.\nWith the photoconductive antenna system, it was demonstrated for the first time\nthat near-field spectroscopy using broadband THz-pulses, is achievable. Hereby, Terahertz\ntime-domain spectroscopy with a mechanical delay stage (THz-TDS) was realized\nto obtain spectroscopic s-SNOM information, with an additional asynchronous\noptical sampling (ASOPS) option for rapid far-field measurements. The near-field\nspectral capabilities of the microscope are demonstrated with measurements on gold\nand on variably doped silicon samples. Here it was shown that the spectral response\nfollows the theoretical prediction according to the Drude and the dipole model.\nWhile the broadband THz-TDS based s-SNOM in principle allows for the parallel\nrecording of the full spectral response, the weak average power of the THz source\nultimately limits the technique to optically investigate selected sample locations\nonly.\nTherefore, for true THz near-field imaging, a FEL as a high-intensity narrowband\nbut highly-tunable THz source in combination with the s-SNOM technique,\nhas been explored. Here, the characteristic near-field signatures at wavelengths from\n35–230 μm are shown. Moreover, the realization of material sensitive THz near-field\nimaging is demonstrated by optically resolving, a structured gold rod with a resolution\nof up to 60 nm at 98 μm wavelength. Not only can the gold be distinguished\nfrom the silica substrate but moreover parts of the structure have been identified\nto be residual resin from the fabrication process. Furthermore, in order to explore\nthe resolution capabilities of the technique, the near-fields of patterned gold nanostructures\n(Fischer pattern) were imaged with a 50 nm resolution at wavelengths\nup to 230 μm (1.2 THz). Finally, the imaging of a topography-independent optical\nmaterial contrast of embedded organic structures, at exemplary 150 μm wavelength\nis shown, thereby demonstrating that the recorded near-field signal alone allows us\nto identify materials on the nanometer scale.\nThe ability to measure spectroscopic images by THz-s-SNOM, will be of benefit\nto fundamental research into nanoscale composites, nano-structured conductivity\nphenomena and metamaterials, and furthermore will enable applications in the\nchemical and electronics industries.