Reliability of 3D-Opto-MID Packages for Asymmetric Optical Bus Couplers

Publikation: Beitrag in Buch/Konferenzbericht/Sammelband/GutachtenBeitrag in KonferenzbandBeigetragenBegutachtung

Beitragende

Abstract

In this paper we investigate the long-term stability and reliability of a 3D-Opto-MID package for multimode waveguide bus coupling. Preliminary works proved an interruption-free coupling approach with asymmetric coupling rates depending on the coupling direction for optical bus systems. This is possible thanks to a coupling at the side-faces of the waveguide cores where one coupling partner has a defined bending to achieve the asymmetric coupling. Crucial for this defined bending are three-dimensional assemblies. For this, we developed a mixed-material package based on ceramic thick-film substrates combined with stereo-lithographic printed polymers. Because of the different material parameters, we analyzed the package behavior in a high temperature storage, a temperature humidity and a temperature cycle test. The results of the reliability tests enable specific further development of the package and thus make an important contribution to the intended series production of the 3D-Opto-MID technology.

Details

OriginalspracheEnglisch
Titel2021 IEEE 71st Electronic Components and Technology Conference (ECTC)
ErscheinungsortSan Diego
Herausgeber (Verlag)Institute of Electrical and Electronics Engineers (IEEE)
Seiten14-21
Seitenumfang8
ISBN (elektronisch)978-1-6654-4097-4
ISBN (Print)978-1-6654-3120-0
PublikationsstatusVeröffentlicht - 2021
Peer-Review-StatusJa

Publikationsreihe

ReiheElectronic Components and Technology Conference (ECTC)
Band2021-June
ISSN0569-5503

Konferenz

Titel2021 IEEE 71st Electronic Components and Technology Conference
KurztitelECTC 2021
Veranstaltungsnummer71
Dauer1 Juni - 4 Juli 2021
Ortonline
LandUSA/Vereinigte Staaten

Externe IDs

ORCID /0000-0002-0757-3325/work/139064764

Schlagworte

Schlagwörter

  • 3D mechatronic integrated device, Interruption-free waveguide coupling, Long-term stability, Mixed-material package, Reliability, Stereo-lithographic printing