Reliability characterization of non-hysteretic charge amplification in MFIM device
Publikation: Beitrag in Fachzeitschrift › Forschungsartikel › Beigetragen › Begutachtung
Beitragende
Abstract
A measurement procedure is presented to characterize the degradation of the hysteresis free charge amplification in unipolar operation of negative capacitance capacitors. Two different degradation processes are identified from these measurements and are related to remanent switching of domains and a change in the electrical internal bias field.
Details
Originalsprache | Englisch |
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Aufsatznummer | 108721 |
Fachzeitschrift | Solid-state electronics |
Jahrgang | 207 |
Publikationsstatus | Veröffentlicht - Sept. 2023 |
Peer-Review-Status | Ja |
Externe IDs
ORCID | /0000-0003-3814-0378/work/142256373 |
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Schlagworte
ASJC Scopus Sachgebiete
Schlagwörter
- Degradation, Ferroelectric, Hafnium zirconium oxide, Measurement, Negative capacitance (NC), Reliability