Reliability characterization of blind-hole vias for a System-in-Foil
Publikation: Beitrag in Buch/Konferenzbericht/Sammelband/Gutachten › Beitrag in Konferenzband › Beigetragen › Begutachtung
Beitragende
Abstract
In this study the bending reliability of an isotropic conductive adhesive (ICA) filled between two printed circuit foils (PCF) as interconnection for a System-in-Foil is evaluated. The filling is realized by a Jet-Dispense process on oxygen plasma treated, as well as non-plasma treated foils. The samples are tested on a bending test setup capable of real-time electrical measurements during bending. A significant improvement of the bending stability is achieved with the plasma treatment process, while the main failure mechanism for the non-plasma treated samples is delamination at the pad-adhesive interface.
Details
Originalsprache | Englisch |
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Titel | Proceedings of the 5th Electronics System-integration Technology Conference (ESTC) |
Erscheinungsort | Helsinki |
Herausgeber (Verlag) | IEEE Xplore |
Seiten | 1-6 |
Seitenumfang | 6 |
ISBN (Print) | 978-1-4799-4026-4 |
Publikationsstatus | Veröffentlicht - 18 Nov. 2014 |
Peer-Review-Status | Ja |
Extern publiziert | Ja |
Publikationsreihe
Reihe | Electronics System-Integration Technology Conference, ESTC |
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ISSN | 2687-9700 |
Konferenz
Titel | 5th Electronics System-Integration Technology Conference, ESTC 2014 |
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Dauer | 16 - 18 September 2014 |
Stadt | Helsinki |
Land | Finnland |
Externe IDs
Scopus | 84918585767 |
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ORCID | /0000-0002-0757-3325/work/139064853 |
Schlagworte
ASJC Scopus Sachgebiete
Schlagwörter
- Plasmas, Resistance, Reliability, Surface treatment, Materials, Conductive adhesives, Filling