Influence of nano silver filler content on properties of ink-jet printed structures for microelectronics

Publikation: Beitrag in Buch/Konferenzbericht/Sammelband/GutachtenBeitrag in KonferenzbandBeigetragenBegutachtung

Beitragende

  • Tomasz Falat - , Wrocław University of Science and Technology (Autor:in)
  • Jan Felba - , Wrocław University of Science and Technology (Autor:in)
  • Andrzej Moscicki - , Amepox Microelectronics, Ltd (Autor:in)
  • Anita Smolarek - , Amepox Microelectronics, Ltd (Autor:in)
  • Karlheinz Bock - , Professur für Aufbau- und Verbindungstechnik der Elektronik, Fraunhofer-Institut für Zuverlässigkeit und Mikrointegration (Autor:in)
  • Detlef Bonfert - , Fraunhofer-Institut für Zuverlässigkeit und Mikrointegration (Autor:in)

Abstract

The influence of nano silver filler content on properties of ink-jet printed structures for microelectronics were investigated. Samples were prepared by using ink with different nano silver filler content: 44%, 41% and 38%. The electrical measurements were performed during and after heating process. It was shown, that filler content does not have a strong influence on sintering time, but it changes the final resistivity of printed and sintered structures. The enhancement of sintering process by UV exposure was also investigated. Preliminary results are promising and the further study will be conducted.

Details

OriginalspracheDeutsch
Titel3rd Electronics System Integration Technology Conference ESTC
Herausgeber (Verlag)Institute of Electrical and Electronics Engineers (IEEE)
Seiten1-5
Seitenumfang5
ISBN (Print)978-1-4244-8554-3
PublikationsstatusVeröffentlicht - 16 Sept. 2010
Peer-Review-StatusJa

Konferenz

Titel3rd Electronics System Integration Technology Conference
KurztitelESTC 2010
Veranstaltungsnummer3
Dauer13 - 16 September 2010
StadtBerlin
LandDeutschland

Externe IDs

Scopus 78651340507
ORCID /0000-0002-0757-3325/work/139064837

Schlagworte

Schlagwörter

  • Ink, Silver, Conductivity, Resistance, Resistance heating, Electrical resistance measurement, Microelectronics