ESD issues in compound semiconductor high-frequency devices and circuits
Publikation: Beitrag in Fachzeitschrift › Forschungsartikel › Eingeladen › Begutachtung
Beitragende
Abstract
The need of ESD protection for high frequency devices and circuits is underlined by reviewing the compound semiconductor material properties with emphasis on ESD stress and by collecting their ESD failure thresholds. Basic requirements for possible ESD protection structures in the microwave frequency regime are discussed and possible ESD protection devices and circuit concepts are proposed.
Details
Originalsprache | Englisch |
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Seiten (von - bis) | 1781-1793 |
Seitenumfang | 13 |
Fachzeitschrift | Microelectronics Reliability |
Jahrgang | 38 |
Ausgabenummer | 11 |
Publikationsstatus | Veröffentlicht - 1998 |
Peer-Review-Status | Ja |
Extern publiziert | Ja |
Externe IDs
ORCID | /0000-0002-0757-3325/work/139064985 |
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Schlagworte
ASJC Scopus Sachgebiete
Schlagwörter
- Compound semiconductor, Electrostatic discharge, ESD, Failure mechanisms, Failure threshold, Field emission, High-frequency, Integrated circuits, Microelectronics, Microwave, MMIC, OEIC, Optoelectronics, Protection, Sensitivity