ESD issues in compound semiconductor high-frequency devices and circuits

Publikation: Beitrag in FachzeitschriftForschungsartikelEingeladenBegutachtung

Beitragende

  • K. Bock - , Interuniversitair Micro-Elektronica Centrum (Autor:in)

Abstract

The need of ESD protection for high frequency devices and circuits is underlined by reviewing the compound semiconductor material properties with emphasis on ESD stress and by collecting their ESD failure thresholds. Basic requirements for possible ESD protection structures in the microwave frequency regime are discussed and possible ESD protection devices and circuit concepts are proposed.

Details

OriginalspracheEnglisch
Seiten (von - bis)1781-1793
Seitenumfang13
FachzeitschriftMicroelectronics Reliability
Jahrgang38
Ausgabenummer11
PublikationsstatusVeröffentlicht - 1998
Peer-Review-StatusJa
Extern publiziertJa

Externe IDs

ORCID /0000-0002-0757-3325/work/139064985

Schlagworte

Schlagwörter

  • Compound semiconductor, Electrostatic discharge, ESD, Failure mechanisms, Failure threshold, Field emission, High-frequency, Integrated circuits, Microelectronics, Microwave, MMIC, OEIC, Optoelectronics, Protection, Sensitivity