Contact Properties of Ultrasmall Carbon Nanotube Transistors from Ab-initio

Publikation: Beitrag in Buch/Konferenzbericht/Sammelband/Gutachten › Beitrag in Konferenzband › Beigetragen › Begutachtung

Beitragende

Abstract

based on large-scale ab-initio calculations contact properties of carbon nanotubes field effect transistors with 9-nm channel were analyzed. We have found that the internal part of the nanotube is metalized, while the uncovered CNT portion is p-doped due to the influence of the metal. Our findings can explain unique scaling of the CNT-FETs based on first-principles.

Details

OriginalspracheEnglisch
Titel2014 IEEE 34th International Scientific Conference on Electronics and Nanotechnology (ELNANO)
ErscheinungsortKyiv
Seiten110-114
Seitenumfang5
ISBN (elektronisch)978-1-4799-4580-1
PublikationsstatusVeröffentlicht - 2014
Peer-Review-StatusJa

Publikationsreihe

ReiheIEEE International Conference on Electronics and Nanotechnology (ELNANO)

Externe IDs

Scopus 84906542817
ORCID /0000-0002-6574-7848/work/211720452

Schlagworte

Schlagwörter

  • Ab-initio, Carbon nanotube transistor, Contact

Bibliotheksschlagworte