Back-bias reconfigurable field effect transistor: A flexible add-on functionality for 22 nm FDSOI
Publikation: Beitrag in Buch/Konferenzbericht/Sammelband/Gutachten › Beitrag in Konferenzband › Beigetragen › Begutachtung
Beitragende
Abstract
Here we present a highly scalable reconfigurable field effect transistor concept, which is capable of dynamically switching between p-type, n-type, and ambipolar operation modes by adaptively changing the applied back-bias. The devices are processed on full-scale 300 mm wafers and reach gate lengths down to 20 nm, integrable into a 22 nm FDSOI platform with only minor process modifications. We demonstrate symmetric IV characteristics of p- and n-program with Im/loFF ratio up to 103 at a VDD of 0.8 V, and propose an exploitation in hardware security. In arnbipolar mode, frequency multiplication requiring only a single transistor is experimentally demonstrated.
Details
| Originalsprache | Englisch |
|---|---|
| Titel | 2021 Silicon Nanoelectronics Workshop, SNW 2021 |
| Herausgeber (Verlag) | Institute of Electrical and Electronics Engineers (IEEE) |
| Seitenumfang | 2 |
| ISBN (elektronisch) | 978-4-86348-781-9 |
| ISBN (Print) | 978-1-6654-0293-4 |
| Publikationsstatus | Veröffentlicht - 2021 |
| Peer-Review-Status | Ja |
Publikationsreihe
| Reihe | IEEE Silicon Nanoelectronics Workshop (SNW) |
|---|
Workshop
| Titel | 26th Silicon Nanoelectronics Workshop |
|---|---|
| Kurztitel | SNW 2021 |
| Veranstaltungsnummer | 26 |
| Dauer | 13 Juni 2021 |
| Webseite | |
| Ort | Online |
| Land | Japan |
Externe IDs
| ORCID | /0000-0003-3814-0378/work/142256168 |
|---|
Schlagworte
ASJC Scopus Sachgebiete
Schlagwörter
- Analog, FDSOl, Reconfigurable, Security, VLSl