An overview of twin-flash™ technology
Publikation: Beitrag zu Konferenzen › Paper › Beigetragen › Begutachtung
Beitragende
Abstract
The twin-flash cell technology relies on the charge trapping storage concept. The concept is described. The fabrication of the technology nodes ranges from 170 nm to 90 nm. The realization of the concept in different cell types is described. The shrink path beyond the 40 nm node is shown and discussed.
Details
Originalsprache | Englisch |
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Seiten | 5-10 |
Seitenumfang | 6 |
Publikationsstatus | Veröffentlicht - 2005 |
Peer-Review-Status | Ja |
Extern publiziert | Ja |
Konferenz
Titel | 2005 Non-Volatile Memory Technology Symposium, NVMTS05 |
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Dauer | 7 - 10 November 2005 |
Stadt | Dallas, TX |
Land | USA/Vereinigte Staaten |
Externe IDs
ORCID | /0000-0003-3814-0378/work/156338413 |
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Schlagworte
ASJC Scopus Sachgebiete
Schlagwörter
- Channel hot electron injection, Hot hole injection, Multi bit storage, Trapped charge storage devices, Twin-Flash