A combinatorial approach to enhance barrier properties of thin films on polymers: Seeding and capping of PECVD thin films by PEALD

Publikation: Beitrag in FachzeitschriftForschungsartikelBeigetragenBegutachtung

Beitragende

  • Maximilian Gebhard - , Ruhr-Universität Bochum (Autor:in)
  • Felix Mitschker - , Ruhr-Universität Bochum (Autor:in)
  • Christian Hoppe - , Universität Paderborn (Autor:in)
  • Morteza Aghaee - , Eindhoven University of Technology (Autor:in)
  • Detlef Rogalla - , Ruhr-Universität Bochum (Autor:in)
  • Mariadriana Creatore - , Eindhoven University of Technology (Autor:in)
  • Guido Grundmeier - , Universität Paderborn (Autor:in)
  • Peter Awakowicz - , Ruhr-Universität Bochum (Autor:in)
  • Anjana Devi - , Ruhr-Universität Bochum (Autor:in)

Abstract

A combinatorial approach to deposit gas barrier layers (GBLs) on polyethylene terephthalate (PET) by means of plasma-enhanced chemical vapor deposition (PECVD) and plasma-enhanced atomic layer deposition (PEALD) is presented. Thin films of SiOx and SiOxCyHz obtained from PECVD were grown either subsequently on a PEALD seeding layer (SiO2) or were capped by ultrathin PEALD films of Al2O3 or SiO2. To study the impact of PEALD layers on the overall GBL performance, PECVD coatings with high macro defect densities and low barrier efficiency with regard to the oxygen transmission rate (OTR) were chosen. PEALD seeding layers demonstrated the ability to influence the subsequent PECVD growth in terms of the lower macro defect density (9 macro-defects mm−2) and improved barrier performance (OTR = 0.8 cm3 m−2 day−1), while the PEALD capping-route produced GBLs free of macro-defects.

Details

OriginalspracheEnglisch
Aufsatznummer1700209
FachzeitschriftPlasma processes and polymers
Jahrgang15
Ausgabenummer5
PublikationsstatusVeröffentlicht - Mai 2018
Peer-Review-StatusJa
Extern publiziertJa

Schlagworte

Schlagwörter

  • cappings, gas barrier layers, PE-ALD, PE-CVD, seedings