In high-current applications, such as gasinsulated switchgear and high-power charging devices, electrical contact elements for high power connectors face significant mechanical and electrical stress, especially during short-circuits. This study investigates physical mechanisms affecting these contact elements during DC short-circuits. The focus is the mechanical stress induced by deflection and its
impact on connector performance. The influence of nonuniform contact resistance on current and temperature distribution during short-circuits is studied. Asymmetrical insertion, caused by electromagnetic forces or lateral forces, leads to variable deflection around the connector circumference and differential mechanical loads on individual contact louvers. Louvers with higher deflection exert higher contact force,
resulting in lower contact resistance, leading to a higher current load and higher power loss during short circuits. Combined with increased mechanical stress due to deflection, these louvers experience a higher reduction in contact force under shortcircuits. Finite element analysis quantifies mechanical stress within contact elements at different deflections. Experiments involving DC short-circuits lasting 0.3 s, 1 s and 4 s across three deflection levels highlight the relationship between mechanical stress and contact force reduction due to relaxation. By correlating experimental data with previous studies, this research enhances understanding of the short-circuit behavior of electrical contact elements in high-power applications