Statistical analysis of structural changes in whole brain based on nonlinear image registration

Publikation: Beitrag in FachzeitschriftKonferenzartikelBeigetragenBegutachtung

Beitragende

  • Christian Gaser - , Friedrich-Schiller-Universität Jena (Autor:in)
  • Stefan Kiebel - , Professur für Kognitive computationale Neurowissenschaft, Friedrich-Schiller-Universität Jena (Autor:in)
  • Stefan Riehemann - , Friedrich-Schiller-Universität Jena (Autor:in)
  • Hans Peter Volz - , Friedrich-Schiller-Universität Jena (Autor:in)
  • Heinrich Sauer - , Friedrich-Schiller-Universität Jena (Autor:in)

Abstract

This paper describes a new method for detecting structural brain differences based on the analysis of deformation fields. Deformations are obtained by a intensity-based nonlinear registration routine which transforms one brain onto another one. We present a general multivariate statistical approach to analyze deformation fields in different subjects. This multivariate general linear model provides the implementation of most forms of experimental designs. We apply our method to the brains of 85 schizophrenic patients and 75 healthy volunteers to examine, whether low frequency deformations are sufficiently sensitive to detect regional deviations in the brains of both groups. We demonstrate the application of the multivariate general linear model to a subtractive (modeling group differences) and a parametric design (testing a linear relationship between one variable and the deformation field).

Details

OriginalspracheEnglisch
Seiten (von - bis)794-801
Seitenumfang8
Fachzeitschrift Proceedings of SPIE - The International Society for Optical Engineering
Jahrgang3661
AusgabenummerII
PublikationsstatusVeröffentlicht - 1999
Peer-Review-StatusJa

Konferenz

TitelProceedings of the 1999 Medical Imaging - Image Processing
Dauer22 - 25 Februar 1999
StadtSan Diego, CA, USA