Synchrotron-based X-ray scattering (SR-XRS) techniques offer the ability to probe nano- and atomic-scale structures that dictate the properties of advanced technological and environmental materials. Important materials studied at the Stanford Synchrotron Radiation Lightsource (SSRL) include organic and inorganic thin films and interfaces, nanoparticles, complex oxides, solutions, polymers, minerals, and poorly crystalline materials. Good planning and a good working knowledge of beamlines and techniques are required to successfully conduct SR-XRS measurements. This sixth annual School at SSRL on Synchrotron X-ray Scattering Techniques in Materials and Environmental Sciences was held at the SLAC National Accelerator Laboratory on May 29-31, 2012, and provided a practical users' guide to planning and conducting scattering measurements at SSRL beam lines. There was an emphasis on information that cannot be found in textbooks. More than 50 researchers, mostly graduate students and postdoctoral associates, participated in this workshop. Attendees represented a variety of fields including material sciences, chemical engineering, applied physics, chemistry and earth sciences.