Role of side-shain branching on thin-film structure and electronic properties of polythiophenes

Publikation: Beitrag in FachzeitschriftForschungsartikelBeigetragenBegutachtung

Beitragende

  • Scott Himmelberger - , Stanford University (Autor:in)
  • Duc T. Duong - , Stanford University (Autor:in)
  • John E. Northrup - , Palo Alto Research Center (Autor:in)
  • Jonathan Rivnay - , Stanford University, École des mines de Saint-Étienne (Autor:in)
  • Felix P.V. Koch - , ETH Zurich (Autor:in)
  • Bryan S. Beckingham - , Lawrence Berkeley National Laboratory (Autor:in)
  • Natalie Stingelin - , Imperial College London (Autor:in)
  • Rachel A. Segalman - , Lawrence Berkeley National Laboratory, University of California at Berkeley, University of California at Santa Barbara (Autor:in)
  • Stefan C.B. Mannsfeld - , Professur für Organische Bauelemente (cfaed) (Autor:in)
  • Alberto Salleo - , Stanford University (Autor:in)

Abstract

Side-chain engineering is increasingly being utilized as a technique to impact the structural order and enhance the electronic properties of semiconducting polymers. However, the correlations drawn between structural changes and the resulting charge transport properties are typically indirect and qualitative in nature. In the present work, a combination of grazing incidence X-ray diffraction and crystallographic refinement calculations is used to determine the precise molecular packing structure of two thiophene-based semiconducting polymers to study the impact of side-chain modifications. The optimized structures provide high-quality fits to the experimental data and demonstrate that in addition to a large difference in interchain spacing between the two materials, there exists a significant disparity in backbone orientation as well. The calculated structures are utilized in density functional theory calculations to determine the band structure of the two materials and are shown to exhibit a dramatic disparity in interchain dispersion which accounts for the large observed difference in charge carrier mobility. The techniques presented here are meant to be general and are therefore applicable to many other highly diffracting semicrystalline polymers.

Details

OriginalspracheEnglisch
Seiten (von - bis)2616-2624
Seitenumfang9
FachzeitschriftAdvanced functional materials
Jahrgang25
Ausgabenummer17
PublikationsstatusVeröffentlicht - 6 Mai 2015
Peer-Review-StatusJa

Schlagworte

Forschungsprofillinien der TU Dresden

Schlagwörter

  • organic semiconductors, polymers, structures, thin films, X-ray diffraction