OpenSpeckle: Open science principles in shearography and ESPI

Publikation: Beitrag in Buch/Konferenzbericht/Sammelband/GutachtenBeitrag in KonferenzbandBeigetragenBegutachtung

Beitragende

Abstract

Shearography and electronic speckle pattern interferometry (ESPI) have historically been developed in limited collaboration. Both techniques have a significant entry barrier for new researchers to get reliable results. The situation is even worse regarding data and code availability: only three documented and publicly available shearography datasets and very limited open software realisations exist. The data sharing aspect gets more critical. First, AI developments are well reported, while only two datasets were published. Second, developments in phase processing are reported without publicly available code. This limits reproducing and validating the results. Following an example from open data challenges in digital image correlation (DIC), this presentation highlights the Open Science issues and proposes three shearography datasets with inspection of composites. This presentation intends to initiate a discussion in the field that could lead to better practices on data and code sharing.

Details

OriginalspracheEnglisch
TitelOptical Measurement Systems for Industrial Inspection XIV
Redakteure/-innenPeter Lehmann, Wolfgang Osten, Armando Albertazzi Gonçalves jr.
Herausgeber (Verlag)SPIE - The international society for optics and photonics
Seitenumfang7
ISBN (elektronisch)9781510690424
PublikationsstatusVeröffentlicht - 8 Aug. 2025
Peer-Review-StatusJa

Publikationsreihe

ReiheProceedings of SPIE - The International Society for Optical Engineering
Band13567
ISSN0277-786X

Konferenz

TitelOptical Measurement Systems for Industrial Inspection XIV
Veranstaltungsnummer14
Beschreibungpart of SPIE Optical Metrology 2025
Dauer23 - 27 Juni 2025
StadtMünchen
LandDeutschland

Externe IDs

ORCID /0000-0002-6817-1020/work/190572606
ORCID /0000-0003-2653-7546/work/190572718
unpaywall 10.1117/12.3061875

Schlagworte

Schlagwörter

  • ESPI, non-destructive inspection, optical metrology, shearography, speckle interferometry