An in-vacuum diffractometer for resonant elastic soft x-ray scattering

Publikation: Beitrag in FachzeitschriftForschungsartikelBeigetragenBegutachtung

Beitragende

  • D. G. Hawthorn - , University of Waterloo (Autor:in)
  • F. He - , University of Saskatchewan (Autor:in)
  • L. Venema - , University of Groningen (Autor:in)
  • H. Davis - , University of British Columbia (Autor:in)
  • A. J. Achkar - , University of Waterloo (Autor:in)
  • J. Zhang - , University of Waterloo (Autor:in)
  • R. Sutarto - , University of British Columbia (Autor:in)
  • H. Wadati - , University of British Columbia, The University of Tokyo (Autor:in)
  • A. Radi - , University of British Columbia (Autor:in)
  • T. Wilson - , University of Saskatchewan (Autor:in)
  • G. Wright - , University of Saskatchewan (Autor:in)
  • K. M. Shen - , Cornell University (Autor:in)
  • J. Geck - , Professur für Physik der Quantenmaterialien, Leibniz-Institut für Festkörper- und Werkstoffforschung Dresden (Autor:in)
  • H. Zhang - , University of Toronto (Autor:in)
  • V. Novák - , Czech Academy of Sciences (Autor:in)
  • G. A. Sawatzky - , University of British Columbia (Autor:in)

Abstract

We describe the design, construction, and performance of a 4-circle in-vacuum diffractometer for resonant elastic soft x-ray scattering. The diffractometer, installed on the resonant elastic and inelastic x-ray scattering beamline at the Canadian Light Source, includes 9 in-vacuum motions driven by in-vacuum stepper motors and operates in ultra-high vacuum at base pressure of 2 × 10-10 Torr. Cooling to a base temperature of 18 K is provided with a closed-cycle cryostat. The diffractometer includes a choice of 3 photon detectors: a photodiode, a channeltron, and a 2D sensitive channelplate detector. Along with variable slit and filter options, these detectors are suitable for studying a wide range of phenomena having both weak and strong diffraction signals. Example measurements of diffraction and reflectivity in Nd-doped (La,Sr)2CuO4 and thin film (Ga,Mn)As are shown.

Details

OriginalspracheEnglisch
Aufsatznummer073104
FachzeitschriftReview of scientific instruments
Jahrgang82
Ausgabenummer7
PublikationsstatusVeröffentlicht - Juli 2011
Peer-Review-StatusJa

Externe IDs

ORCID /0000-0002-2438-0672/work/159172174

Schlagworte

ASJC Scopus Sachgebiete