A simplified model for a NbO2 Mott memristor physical realization
Publikation: Beitrag in Buch/Konferenzbericht/Sammelband/Gutachten › Beitrag in Konferenzband › Beigetragen › Begutachtung
Beitragende
Abstract
In this paper, we propose a new model for practical, nano-scale, NbO2-based Mott memristors, which is based on a thorough analysis performed on a recently presented physics-based model for these devices. Our investigations revealed that the 3D Poole-Frenkel conduction mechanism adopted in the aforementioned model, can be well-approximated by a transport equation in which: a) memristor current is expressed as a linear function of memristor voltage and b) the device memductance is solely dependent on the device temperature which represents the memristor state. The resulting simplified mathematical form of the original differential algebraic equation set is not only more suitable for simulating large-scale, nano-scale NbO2-based memristor circuits, but is also ideal for circuit-theoretic investigations which may allow an in depth understanding of the peculiar nonlinear behaviors of these devices.
Details
| Originalsprache | Englisch |
|---|---|
| Titel | 2020 IEEE International Symposium on Circuits and Systems (ISCAS) |
| Herausgeber (Verlag) | Institute of Electrical and Electronics Engineers (IEEE) |
| Seiten | 1-5 |
| Seitenumfang | 5 |
| ISBN (elektronisch) | 9781728133201 |
| ISBN (Print) | 978-1-7281-3320-1 |
| Publikationsstatus | Veröffentlicht - 14 Okt. 2020 |
| Peer-Review-Status | Ja |
Publikationsreihe
| Reihe | IEEE International Symposium on Circuits and Systems (ISCAS) |
|---|---|
| ISSN | 0271-4302 |
Konferenz
| Titel | IEEE International Symposium on Circuits and Systems 2020 |
|---|---|
| Kurztitel | ISCAS 2020 |
| Veranstaltungsnummer | 52 |
| Dauer | 10 - 21 Oktober 2020 |
| Webseite | |
| Ort | online |
| Stadt | Virtual, Online |
| Land | Spanien |
Externe IDs
| ORCID | /0000-0001-7436-0103/work/142240288 |
|---|---|
| Scopus | 85109341906 |
Schlagworte
ASJC Scopus Sachgebiete
Schlagwörter
- Memristors, Mathematical model, Numerical models, Current density, Resistance, Temperature dependence, Temperature