The year 2024 marks the 100th anniversary of the prediction of X-ray interferences from lattice sources by W. Kossel. The μ-X-ray Kossel Diffraction (μXKD) can be easily applied in combination with EBSD as additional complementary diffraction method in a SEM or in a microprobe. It has the highest informational content and precision compared to conventional diffraction methods. It is simply possible to use one single scintillator CCD detector combination to observe both diffraction methods, which will be especially discussed more in detail here, as our group has successfully demonstrated over 25 years. A historical overview of selected applications will be given as review, besides of precise local lattice constants measurements, the determination of phase angles of the structure factor and polar planes in non-centrosymmetric crystals at the semiconductors GaP and GaAs, the estimation of dislocation densities in sinter model materials, the local measurement of the thermal conductivity as well as thermal expansion coefficients and the phase identification in Au-Ti diffusion zones as example.