0.18-V input charge pump with forward body biasing in startup circuit using 65nm CMOS

Publikation: Beitrag in Buch/Konferenzbericht/Sammelband/GutachtenBeitrag in KonferenzbandBeigetragenBegutachtung

Beitragende

  • Po-Hung Chen - , Tokyo University of Agriculture (Autor:in)
  • Koichi Ishida - , Professur für Schaltungstechnik und Netzwerktheorie, Tokyo University of Agriculture (Autor:in)
  • Xin Zhang - , Professur für Physikalische Chemie, Tokyo University of Agriculture (Autor:in)
  • Yasuaki Okuma - , Semiconductor Technology Academic Research Center (STARC) (Autor:in)
  • Yoshikatsu Ryu - , Semiconductor Technology Academic Research Center (STARC) (Autor:in)
  • Makoto Takamiya - , Tokyo University of Agriculture (Autor:in)
  • Takayasu Sakurai - , Tokyo University of Agriculture (Autor:in)

Abstract

In this paper, a 0.18-V input three-stage charge pump circuit applying forward body bias is proposed. In the developed charge pump, all the MOSFETs are forward body biased by using the inter-stage/output voltages. By applying the proposed charge pump as the startup in the boost converter, the lower kick-up input voltage of the boost converter can be achieved. To verify the circuit characteristics, four test circuits have been implemented by using 65nm CMOS process. The measured available output current of the proposed charge pump under 0.18-V input voltage can be improved more than 150%. In addition, the boost converter can successfully been boosted from 0.18-V input to the 0.74-V output under 6mA output current. The proposed circuit is suitable for extremely low voltage applications such as harvesting energy sources.

Details

OriginalspracheEnglisch
TitelIEEE Custom Integrated Circuits Conference 2010
Herausgeber (Verlag)Institute of Electrical and Electronics Engineers (IEEE)
Seiten1-4
Seitenumfang4
ISBN (Print)978-1-4244-5759-5
PublikationsstatusVeröffentlicht - 22 Sept. 2010
Peer-Review-StatusJa

Konferenz

TitelIEEE Custom Integrated Circuits Conference 2010
Dauer19 - 22 September 2010
OrtSan Jose, CA, USA

Externe IDs

Scopus 78649814009
ORCID /0000-0002-4152-1203/work/165453405

Schlagworte

Schlagwörter

  • Charge pumps, Converters, Voltage measurement, MOSFETs, Clocks, CMOS integrated circuits, Generators