Stress induced movement of ferroelastic domain walls in BaTiO3 single crystals evaluated by scanning force microscopy

Research output: Contribution to journalResearch articleContributedpeer-review

Contributors

Abstract

We report on the quantitative investigation of lateral domain wall motion in BaTiO3 single crystals subjected to a compressive unidirectional mechanical stress. Simultaneous to the mechanical testing, the single crystals prepared by the modified exaggerated growth method were characterized by scanning force microscopy and piezoresponse force microscopy (PFM) which allow both topographical details and the true three-dimensional ferroelectric domain configuration to be reproduced simultaneously. Stress induced domain formation is initiated at the sample surface followed by the forward- and lateral-domain growth both perpendicular and parallel to the direction of induced stress. Knowing the crystallographic orientation of the BaTiO3 single crystal (from Kikuchi patterns) clearly associates our experimental observations with a 90° domain switching process, in accordance with a theoretical model. Additionally, 180° ferroelectric domain boundaries (a-domains) were detected with PFM which are not visible from the sample topography. The formation of these newly formed domains is driven by the compensation of the positive surface charge arising from the ferroelastic growth of C+ domains.

Details

Original languageEnglish
Pages (from-to)L402-L410
JournalSurface science
Volume480
Issue number1-2
Publication statusPublished - 30 May 2001
Peer-reviewedYes

External IDs

ORCID /0000-0002-2484-4158/work/158768117

Keywords

Keywords

  • Growth, Nucleation, Piezoelectric effect, Single crystal surfaces, Surface stress