Non-uniform triggering of gg-nMOSt investigated by combined emission microscopy and transmission line pulsing

Research output: Contribution to book/conference proceedings/anthology/report › Conference contribution › Contributed › peer-review

Contributors

  • Christian Russ - , Interuniversitair Micro-Elektronica Centrum (Author)
  • Karlheinz Bock - , Interuniversitair Micro-Elektronica Centrum (Author)
  • Mahmoud Rasras - , Interuniversitair Micro-Elektronica Centrum (Author)
  • Ingrid De Wolf - , Interuniversitair Micro-Elektronica Centrum (Author)
  • Guido Groeseneken - , Interuniversitair Micro-Elektronica Centrum (Author)
  • Herman E. Maes - , Interuniversitair Micro-Elektronica Centrum (Author)

Abstract

The triggering of gg-nMOS and field-oxide devices, essential for optimized protection design, is addressed fly TLP-pulsed emission microscopy. Current non-uniformity and instability effects in snapback operation under DC and TLP conditions are demonstrated. The comprehensive correlation of emission and electrical behavior allows an improved interpretation of device operation. Technological influences on the trigger uniformity are discussed.

Details

Original languageEnglish
Title of host publicationElectrical Overstress/ Electrostatic Discharge Symposium Proceedings. 1998 (Cat. No.98TH8347)
Pages177-186
Number of pages10
Publication statusPublished - 1998
Peer-reviewedYes
Externally publishedYes

Publication series

Series Electrical Overstress Electrostatic Discharge Symposium proceedings
ISSN0739-5159

Conference

TitleProceedings of the 1998 20th Annual International EOS/ESD Symposium
Duration6 - 8 October 1998
CityReno, NV, USA

External IDs

ORCID /0000-0002-0757-3325/work/139064817

Keywords

ASJC Scopus subject areas